Multiparameter fitting of multilayers.
Supports reflectometry and transmission simulation, off-specular scattering, GISAXS.
Svechnikov, M. (2020). Multifitting : software for the reflectometric reconstruction of multilayer nanofilms. Journal of Applied Crystallography, 53(1), 244–252. https://doi.org/10.1107/S160057671901584X