void erase_flash_sector(uint32_t sector_addr)
{
uint16_t erase_id = 0;
uint32_t addr = 0;
if(sector_addr == (sector_addr & FLASH_END_ADDR))
{
erase_id = IAP_ERAS_SECT;
addr = sector_addr;
}
else if((sector_addr >= DAT0_START_ADDR) && (sector_addr == (sector_addr & DAT0_END_ADDR)))
{
erase_id = IAP_ERAS_DAT0;
addr = 0;
}
else if((sector_addr >= DAT1_START_ADDR) && (sector_addr == (sector_addr & DAT1_END_ADDR)))
{
erase_id = IAP_ERAS_DAT1;
addr = 0;
}
else
{
#ifdef _FLASH_DEBUG_
printf(" > FLASH:SECTOR_ERASE_FAILED: [0x%.8x]\r\n", sector_addr);
#endif
return;
}
__disable_irq();
DO_IAP(erase_id, addr, 0, 0);
__enable_irq();
}
int write_flash(uint32_t addr, uint8_t *data, uint32_t data_len)
{
__disable_irq();
DO_IAP(IAP_PROG,addr,(unsigned char*)data,data_len);
__enable_irq();
return data_len;
}
void erase_flash_block(uint32_t block_addr)
{
if(block_addr != (block_addr & FLASH_END_ADDR))
{
#ifdef _FLASH_DEBUG_
printf(" > FLASH:BLOCK_ERASE_FAILED: [0x%.8x]\r\n", block_addr);
#endif
return; // masking;
}
__disable_irq();
DO_IAP(IAP_ERAS_BLCK, block_addr, 0, 0);
__enable_irq();
}
uint32_t write_flash(uint32_t addr, uint8_t * data, uint32_t data_len)
{
// Invalid memory address range: Data blocks
if((addr >= DAT0_START_ADDR) && (addr == (addr & DAT1_END_ADDR)))
{
if((data_len > SECT_SIZE) || (DAT0_START_ADDR + data_len > DAT1_END_ADDR))
{
#ifdef _FLASH_DEBUG_
printf(" > FLASH:WRITE_FAILED: Invalid memory address range [0x%.8x]\r\n", addr);
#endif
return 0;
}
}
// Invalid data_len
if((data_len == 0) && (addr + data_len > DAT1_END_ADDR))
{
#ifdef _FLASH_DEBUG_
printf(" > FLASH:WRITE_FAILED: Invalid data length [%d]\r\n", data_len);
#endif
return 0; // (Max ~ 0x0003FFFF)
}
// Invalid memory address range: Information block, Do not access
if((addr > FLASH_END_ADDR) && (addr < DAT0_START_ADDR))
{
#ifdef _FLASH_DEBUG_
printf(" > FLASH:WRITE_FAILED: Invalid memory address range [0x%.8x]\r\n", addr);
#endif
return 0;
}
__disable_irq();
DO_IAP(IAP_PROG, addr, data, data_len);
__enable_irq();
return data_len;
}
void erase_flash_block(uint32_t block_addr)
{
__disable_irq();
DO_IAP(IAP_ERAS_BLCK,block_addr,0,0);
__enable_irq();
}
void erase_flash_page(uint32_t page_addr)
{
__disable_irq();
DO_IAP(IAP_ERAS_SECT,page_addr,0,0);
__enable_irq();
}
/**
* @brief Main Function
*/
int main()
{
uint32_t i,result;
SystemInit();
// *(volatile uint32_t *)(0x41001014) = 0x0060100; //clock setting 48MHz
/* CLK OUT Set */
// PAD_AFConfig(PAD_PA,GPIO_Pin_2, PAD_AF2); // PAD Config - CLKOUT used 3nd Function
#ifdef __DEBUG
UART_StructInit(&UART_InitStructure);
UART_Init(USING_UART,&UART_InitStructure);
UartPuts(USING_UART,"Test Start\r\n");
#endif
// Make Dummy Data for Flash Write Test
for(i=0;i<SECT_SIZE;i++)
{
save_buff[i] = i;
}
// Step 1 DATA0 Erase, Read, Write Test
DO_IAP(IAP_ERAS_DAT0,0,0,0);
DO_IAP(IAP_PROG,DAT0_START_ADDR,save_buff,SECT_SIZE);
result = Buffercmp((uint8_t*)save_buff,((uint8_t *)(DAT0_START_ADDR)),SECT_SIZE);
#ifdef __DEBUG
if(result == PASSED)
UartPuts(USING_UART,"Step1 Test Passed\r\n");
else
UartPuts(USING_UART,"Step1 Test Falied\r\n");
#endif
// Step 2 DATA1 Erase, Read, Write Test
DO_IAP(IAP_ERAS_DAT1,0,0,0);
DO_IAP(IAP_PROG,DAT1_START_ADDR,save_buff,SECT_SIZE);
result = Buffercmp((uint8_t*)save_buff,((uint8_t *)(DAT1_START_ADDR)),SECT_SIZE);
#ifdef __DEBUG
if(result == PASSED)
UartPuts(USING_UART,"Step2 Test Passed\r\n");
else
UartPuts(USING_UART,"Step2 Test Falied\r\n");
#endif
// Step 3 Code Flash Block Erase, Read, Write Test
for(i=0;i<BLOCK_SIZE;i++)
{
save_buff[i] = i;
}
DO_IAP(IAP_ERAS_BLCK,CODE_TEST_ADDR,0,0);
DO_IAP(IAP_PROG, CODE_TEST_ADDR,save_buff,BLOCK_SIZE);
result = Buffercmp((uint8_t*)save_buff,((uint8_t *)(CODE_TEST_ADDR)),BLOCK_SIZE);
#ifdef __DEBUG
if(result == PASSED)
UartPuts(USING_UART,"Step3 Test Passed\r\n");
else
UartPuts(USING_UART,"Step3 Test Falied\r\n");
#endif
}
