/**
* \brief Application entry point for AT30TS(E)75x Component Example.
*
* \return Unused (ANSI-C compatibility).
*/
int main(void)
{
double temp = 0;
/* Initialize the SAM system */
sysclk_init();
/* Initialize the board */
board_init();
/* Initialize the console UART */
configure_console();
/* Output example information */
puts(STRING_HEADER);
memset(tx, 0xFF, NB_BYTE);
/* Initialize AT30TS(E)75x */
at30tse_init();
#if BOARD_USING_AT30TSE != AT30TS75
uint32_t i;
/* Write pages in EEPROM */
for (i = 0; i < NB_PAGE; i++) {
tx[NB_PAGE - 1] = i;
if (at30tse_eeprom_write(tx, NB_BYTE, 0, i) != TWI_SUCCESS) {
puts("Write EEPROM error\r");
return 0;
}
delay_ms(5);
}
puts("Write EEPROM OK\r");
/* Read each page in EEPROM and compare them */
for (i = 0; i < NB_PAGE; i++) {
memset(rx, 0, NB_BYTE);
if (at30tse_eeprom_read(rx, NB_BYTE, 0, i) != TWI_SUCCESS) {
puts("Read EEPROM error\r");
return 0;
} else {
if (memcmp(tx, rx, NB_BYTE - 1) && (rx[NB_PAGE - 1] != i)) {
puts("Comparison error\r");
return 0;
}
}
}
puts("Read EEPROM & Compare OK\r");
#endif
/* Read temperature every second */
while (1) {
if (at30tse_read_temperature(&temp) != TWI_SUCCESS) {
puts("Read temperature error\r");
return 0;
}
printf("Read temperature:\t%d\r\n", (int)temp);
delay_ms(1000);
}
}
/**
* \brief AT30TS(E)75x read and comparison EEPROM test.
*
* \param test Current test case.
*/
static void run_test_read_compare_data(const struct test_case *test)
{
memset(rx, 0, NB_BYTE);
test_assert_true(test,
at30tse_eeprom_read(rx, NB_BYTE, 0,
(int)temp % NB_PAGE) == TWI_SUCCESS,
"Error: AT30TS(E)75x read failed\n\r");
test_assert_true(test,
!memcmp(tx, rx, NB_BYTE),
"Error: AT30TS(E)75x comparison failed\n\r");
}
int main(void)
{
volatile double temper_value;
volatile bool data_check_status1 = true,
data_check_status2 = true;
uint32_t i;
system_clock_config(CLOCK_RESOURCE_XO_26_MHZ, CLOCK_FREQ_26_MHZ);
/* Initialize AT30TS(E)75x */
at30tse_init();
/* First round data check */
for (i = 0; i < NB_BYTE; i++) {
tx_buffer[i] = i;
}
/* Write pages in EEPROM */
for (i = 0; i < NB_PAGE; i++) {
at30tse_eeprom_write(tx_buffer, NB_BYTE, 0, i);
delay(200);
}
/* Read each page in EEPROM and compare them */
for (i = 0; i < NB_PAGE; i++) {
memset(rx_buffer, 0, NB_BYTE);
at30tse_eeprom_read(rx_buffer, NB_BYTE, 0, i);
if (memcmp(tx_buffer, rx_buffer, NB_BYTE)) {
data_check_status1 = false;
break;
}
}
/* Second round data check */
for (i = 0; i < NB_BYTE; i++) {
tx_buffer[i] = NB_BYTE - i;
}
/* Write pages in EEPROM */
for (i = 0; i < NB_PAGE; i++) {
at30tse_eeprom_write(tx_buffer, NB_BYTE, 0, i);
delay(200);
}
/* Read each page in EEPROM and compare them */
for (i = 0; i < NB_PAGE; i++) {
memset(rx_buffer, 0, NB_BYTE);
at30tse_eeprom_read(rx_buffer, NB_BYTE, 0, i);
if (memcmp(tx_buffer, rx_buffer, NB_BYTE)) {
data_check_status2 = false;
break;
}
}
/* Read thigh and tlow */
volatile uint16_t thigh = 0;
thigh = at30tse_read_register(AT30TSE_THIGH_REG,
AT30TSE_NON_VOLATILE_REG, AT30TSE_THIGH_REG_SIZE);
volatile uint16_t tlow = 0;
tlow = at30tse_read_register(AT30TSE_TLOW_REG,
AT30TSE_NON_VOLATILE_REG, AT30TSE_TLOW_REG_SIZE);
/* Set 12-bit resolution mode. */
at30tse_write_config_register(
AT30TSE_CONFIG_RES(AT30TSE_CONFIG_RES_12_bit));
while (1) {
/* Read current temperature. */
temper_value = at30tse_read_temperature();
}
UNUSED(data_check_status1);
UNUSED(data_check_status2);
UNUSED(temper_value);
UNUSED(tlow);
UNUSED(thigh);
}
