/**
* \brief Test AFEC in TC trigger mode,
* which also tests interrupt driven conversions.
*
* \param test Current test case.
*/
static void run_afec_tc_trig_test(const struct test_case *test)
{
configure_tc_trigger();
afec_set_callback(AFEC0, AFEC_INTERRUPT_DATA_READY,
afec_set_data_ready_flag, 1);
delay_ms(2000);
test_assert_true(test, is_data_ready == true,
"AFEC using TC trigger test failed");
}
/**
* \brief Application entry point.
*
* \return Unused (ANSI-C compatibility).
*/
int main(void)
{
int32_t ul_vol;
/* Initialize the SAM system. */
sysclk_init();
board_init();
configure_console();
/* Output example information. */
puts(STRING_HEADER);
adc_enable();
struct adc_config adc_cfg;
adc_get_config_defaults(&adc_cfg);
adc_init(ADC, &adc_cfg);
adc_channel_enable(ADC, ADC_CHANNEL_11);
adc_set_trigger(ADC, ADC_TRIG_TIO_CH_0);
adc_set_callback(ADC, ADC_INTERRUPT_EOC_11,
adc_end_conversion, 1);
set_adc_resolution();
adc_start_calibration(ADC);
/* Configure TC */
configure_tc_trigger();
while (1) {
/* Check if ADC sample is done. */
if (is_conversion_done == true) {
ul_vol = g_ul_value * VOLT_REF / g_max_digital;
printf("-- Voltage is: %4dmv\r\n", (int)ul_vol);
is_conversion_done = false;
}
}
}
/**
* \brief Set AFEC test mode.
*/
static void set_afec_test(void)
{
uint8_t uc_key;
struct afec_config afec_cfg;
struct afec_ch_config afec_ch_cfg;
display_menu();
afec_enable(AFEC0);
afec_get_config_defaults(&afec_cfg);
afec_ch_get_config_defaults(&afec_ch_cfg);
while (uart_read(CONF_UART, &uc_key));
switch (uc_key) {
case '0':
/*
* This test will use AFEC0 channel4 to connect with external input.
* Setting gain = 4, if external input voltage is 100mv,
* the ouput result should be 1650 + 100 * 4 = 2050mv .
*/
puts("Gain Test \n\r");
g_delay_cnt = 1000;
afec_init(AFEC0, &afec_cfg);
afec_ch_cfg.gain = AFEC_GAINVALUE_3;
afec_ch_set_config(AFEC0, AFEC_CHANNEL_4, &afec_ch_cfg);
afec_set_trigger(AFEC0, AFEC_TRIG_SW);
afec_channel_enable(AFEC0, AFEC_CHANNEL_4);
afec_set_callback(AFEC0, AFEC_INTERRUPT_DATA_READY, afec0_data_ready, 1);
afec_start_calibration(AFEC0);
while((afec_get_interrupt_status(AFEC0) & AFEC_ISR_EOCAL) != AFEC_ISR_EOCAL);
break;
case '1':
/*
* This test will use AFEC0 channel5 to connect with potentiometer and
* AFEC1 channel0 to connect with external input. The AFEC0 conversion
* is triggered by software every 3s and AFEC1 conversion is triggered
* by TC every 1s.
*/
puts("Dual AFEC Conversion Test \n\r");
g_delay_cnt = 3000;
afec_enable(AFEC1);
afec_init(AFEC0, &afec_cfg);
afec_init(AFEC1, &afec_cfg);
afec_ch_set_config(AFEC0, AFEC_CHANNEL_POTENTIOMETER, &afec_ch_cfg);
afec_ch_set_config(AFEC1, AFEC_CHANNEL_0, &afec_ch_cfg);
/*
* Because the internal AFEC offset is 0x800, it should cancel it and shift
* down to 0.
*/
afec_channel_set_analog_offset(AFEC1, AFEC_CHANNEL_0, 0x800);
afec_channel_set_analog_offset(AFEC0, AFEC_CHANNEL_POTENTIOMETER, 0x800);
afec_set_trigger(AFEC0, AFEC_TRIG_SW);
configure_tc_trigger();
afec_channel_enable(AFEC1, AFEC_CHANNEL_0);
afec_channel_enable(AFEC0, AFEC_CHANNEL_POTENTIOMETER);
afec_set_callback(AFEC0, AFEC_INTERRUPT_DATA_READY, afec0_data_ready, 1);
afec_set_callback(AFEC1, AFEC_INTERRUPT_DATA_READY, afec1_data_ready, 1);
afec_start_calibration(AFEC0);
while((afec_get_interrupt_status(AFEC0) & AFEC_ISR_EOCAL) != AFEC_ISR_EOCAL);
afec_start_calibration(AFEC1);
while((afec_get_interrupt_status(AFEC1) & AFEC_ISR_EOCAL) != AFEC_ISR_EOCAL);
break;
case '2':
/*
* This test will use AFEC0 channl4 and channel5 as positive and
* negative input, so the output result is external input voltage subtracting
* potentiometer voltage. The differential voltage range is -1.65v~ +1.65v.
*/
puts("Differential Input Test \n\r");
g_delay_cnt = 1000;
afec_init(AFEC0, &afec_cfg);
afec_ch_cfg.diff = true;
afec_ch_set_config(AFEC0, AFEC_CHANNEL_POTENTIOMETER, &afec_ch_cfg);
afec_ch_set_config(AFEC0, AFEC_CHANNEL_4, &afec_ch_cfg);
afec_set_trigger(AFEC0, AFEC_TRIG_SW);
afec_channel_enable(AFEC0, AFEC_CHANNEL_4);
afec_channel_enable(AFEC0, AFEC_CHANNEL_POTENTIOMETER);
afec_set_callback(AFEC0, AFEC_INTERRUPT_DATA_READY, afec0_diff_data_ready, 1);
afec_start_calibration(AFEC0);
while((afec_get_interrupt_status(AFEC0) & AFEC_ISR_EOCAL) != AFEC_ISR_EOCAL);
break;
case '3':
/*
* This test will configure user sequence channel1, channel0,
* so the first conversion is is channel1 and next is channel0.
* The output information will show this.
*/
puts("User Sequence Test \n\r");
g_delay_cnt = 1000;
afec_init(AFEC0, &afec_cfg);
afec_ch_set_config(AFEC0, AFEC_CHANNEL_0, &afec_ch_cfg);
afec_ch_set_config(AFEC0, AFEC_CHANNEL_1, &afec_ch_cfg);
afec_channel_enable(AFEC0, AFEC_CHANNEL_0);
afec_channel_enable(AFEC0, AFEC_CHANNEL_1);
afec_configure_sequence(AFEC0, ch_list, 2);
afec_set_callback(AFEC0, AFEC_INTERRUPT_EOC_0, afec_eoc_0, 1);
afec_set_callback(AFEC0, AFEC_INTERRUPT_EOC_1, afec_eoc_1, 1);
afec_start_calibration(AFEC0);
while((afec_get_interrupt_status(AFEC0) & AFEC_ISR_EOCAL) != AFEC_ISR_EOCAL);
break;
case '4':
/*
* This test use AFEC0 channel4 to connect with external input.
* It integrate the enhanced resolution test and gain and offset test.
*/
puts("Typical Application Test \n\r");
g_delay_cnt = 1000;
g_max_digital = MAX_DIGITAL_12_BIT * 16;
afec_cfg.resolution = AFEC_16_BITS;
afec_init(AFEC0, &afec_cfg);
afec_ch_cfg.gain = AFEC_GAINVALUE_3;
afec_ch_set_config(AFEC0, AFEC_CHANNEL_4, &afec_ch_cfg);
afec_set_trigger(AFEC0, AFEC_TRIG_SW);
afec_channel_enable(AFEC0, AFEC_CHANNEL_4);
afec_set_callback(AFEC0, AFEC_INTERRUPT_DATA_READY, afec0_data_ready, 1);
afec_start_calibration(AFEC0);
while((afec_get_interrupt_status(AFEC0) & AFEC_ISR_EOCAL) != AFEC_ISR_EOCAL);
break;
default:
puts("Please select feature test correctly! \n\r");
break;
}
}
