status_code_t nvm_write(mem_type_t mem, uint32_t address, void *buffer,
uint32_t len)
{
switch (mem) {
case INT_FLASH:
case INT_USERPAGE:
flash_api_memcpy((volatile void *)address, (const void *)buffer,
len, true);
break;
#if defined(USE_EXTMEM) && defined(CONF_BOARD_AT45DBX)
case AT45DBX:
{
uint32_t sector = address / AT45DBX_SECTOR_SIZE;
if (!at45dbx_write_sector_open(sector)) {
return ERR_BAD_ADDRESS;
}
at45dbx_write_sector_from_ram((const void *)buffer);
at45dbx_write_close();
}
break;
#endif
default:
return ERR_INVALID_ARG;
}
return STATUS_OK;
}
Ctrl_status at45dbx_ram_2_df(U32 addr, const void *ram)
{
if (addr + 1 > AT45DBX_MEM_CNT << (AT45DBX_MEM_SIZE - AT45DBX_SECTOR_BITS)) {
return CTRL_FAIL;
}
at45dbx_write_sector_open(addr);
at45dbx_write_sector_from_ram(ram);
at45dbx_write_close();
return CTRL_GOOD;
}
status_code_t nvm_write(mem_type_t mem, uint32_t address, void *buffer,
uint32_t len)
{
switch (mem) {
case INT_FLASH:
#if SAM4S
/*! This erases 8 pages of flash before writing */
if (flash_erase_page(address, IFLASH_ERASE_PAGES_8)) {
return ERR_INVALID_ARG;
}
if (flash_write(address, (const void *)buffer, len, false)) {
return ERR_INVALID_ARG;
}
#elif SAM4L
flashcalw_memcpy((volatile void *)address, (const void *)buffer,
len, true);
#else
if (flash_write(address, (const void *)buffer, len, true)) {
return ERR_INVALID_ARG;
}
#endif
break;
#if SAM4S
case INT_USERPAGE:
if (flash_write_user_signature((const void *)buffer, len)) {
return ERR_INVALID_ARG;
}
break;
#endif
#if defined(USE_EXTMEM) && defined(CONF_BOARD_AT45DBX)
case AT45DBX:
{
uint32_t sector = address / AT45DBX_SECTOR_SIZE;
if (!at45dbx_write_sector_open(sector)) {
return ERR_BAD_ADDRESS;
}
at45dbx_write_sector_from_ram((const void *)buffer);
at45dbx_write_close();
}
break;
#endif
default:
return ERR_INVALID_ARG;
}
return STATUS_OK;
}
/**
* \brief Test the read and write multiple sector operations on the DataFlash
*
* This function will test the read and write functionalities of the DataFlash
* using multiple sector access. It will first fill the 10 first DataFlash
* sectors with a known pattern and read it back to test each value.\n
*
* \param test Current test case.
*/
static void run_multiple_sector_access_test(const struct test_case *test)
{
bool status;
uint32_t i;
uint8_t value, cur_sector;
uint8_t expected;
/* Write the ram sector to the DataFlash
*/
status = at45dbx_write_sector_open(0);
test_assert_true(test, status == true,
"Cannot open the DataFlash memory for write access");
cur_sector = 0;
while (cur_sector++ < 10) {
/* Fills a ram sector with a known pattern
*/
for (i=0; i<AT45DBX_SECTOR_SIZE; i++) {
value = BYTE_PATTERN3(cur_sector * AT45DBX_SECTOR_SIZE + i);
((uint8_t *) sector_buf)[i] = value;
}
/* Write sector on DataFlash */
status = at45dbx_write_sector_from_ram(sector_buf);
test_assert_true(test, status == true,
"Error while writing sector # %i", cur_sector);
}
at45dbx_write_close();
/* Read back the sector of the DataFlash
*/
status = at45dbx_read_sector_open(0);
test_assert_true(test, status == true,
"Cannot open the DataFlash memory for read access");
cur_sector = 0;
while (cur_sector++ < 10) {
// Read the next sector.
status = at45dbx_read_sector_to_ram(sector_buf);
test_assert_true(test, status == true,
"Error while reading sector # %i", cur_sector);
/* Test each values of the current sector
*/
for (i=0; i<AT45DBX_SECTOR_SIZE; i++) {
expected = BYTE_PATTERN3(cur_sector * AT45DBX_SECTOR_SIZE + i);
test_assert_true(test, ((uint8_t *) sector_buf)[i] == expected,
"Value not expected @ 0x%08x in sector # %i"
" (read: 0x%02x, expected: 0x%02x)", i,
cur_sector, ((uint8_t *) sector_buf)[i],
expected);
}
}
at45dbx_read_close();
}
Ctrl_status at45dbx_usb_write_10(U32 addr, U16 nb_sector)
{
if (addr + nb_sector > AT45DBX_MEM_CNT << (AT45DBX_MEM_SIZE - AT45DBX_SECTOR_BITS)){
return CTRL_FAIL;
}
at45dbx_write_sector_open(addr);
while (nb_sector--) {
// Write the next sector.
udi_msc_trans_block( false, sector_buf, AT45DBX_SECTOR_SIZE, NULL);
at45dbx_write_sector_from_ram(sector_buf);
}
at45dbx_write_close();
return CTRL_GOOD;
}
/**
* \brief Test the read and write sector operations on the DataFlash
*
* This function will test the read and write functionalities of the DataFlash
* using sector access. It will first fill a sector with a known pattern and
* read it back by testing each value read.\n
*
* \param test Current test case.
*/
static void run_sector_access_test(const struct test_case *test)
{
uint32_t i;
bool status;
/* Fills a ram sector with a known pattern
*/
for (i=0; i<AT45DBX_SECTOR_SIZE; i++) {
sector_buf[i] = BYTE_PATTERN2(i);
}
/* Write the ram sector to the DataFlash
*/
status = at45dbx_write_sector_open(0);
test_assert_true(test, status == true,
"Cannot open the DataFlash memory for write access");
status = at45dbx_write_sector_from_ram(sector_buf);
test_assert_true(test, status == true,
"Write sector operation error");
at45dbx_write_close();
/* Clear the ram sector buffer
*/
for (i=0; i<AT45DBX_SECTOR_SIZE; i++) {
sector_buf[i] = 0;
}
/* Read back the sector of the DataFlash
*/
status = at45dbx_read_sector_open(0);
test_assert_true(test, status == true,
"Cannot open the DataFlash memory for read access");
status = at45dbx_read_sector_to_ram(sector_buf);
test_assert_true(test, status == true,
"Read sector operation error");
at45dbx_read_close();
/* Compare the values read from the DataFlash with the expected values
*/
for (i=0; i<AT45DBX_SECTOR_SIZE; i++) {
test_assert_true(test, sector_buf[i] == BYTE_PATTERN2(i),
"Value not expected @ 0x%08x (read: 0x%02x,"
" expected: 0x%02x)", i, sector_buf[i],
BYTE_PATTERN2(i));
}
}
/*! \brief Main function.
*/
int main(void)
{
uint16_t i;
// Initialize the system - clock and board.
system_init();
at45dbx_init();
if(at45dbx_mem_check()==true) {
port_pin_set_output_level(DATA_FLASH_LED_EXAMPLE_0, false);
} else
{
test_ko();
}
// Prepare half a data flash sector to 0xAA
for(i=0;i<AT45DBX_SECTOR_SIZE/2;i++) {
ram_buf[i]=0xAA;
}
// And the remaining half to 0x55
for(;i<AT45DBX_SECTOR_SIZE;i++) {
ram_buf[i]=0x55;
}
at45dbx_write_sector_open(TARGET_SECTOR);
at45dbx_write_sector_from_ram(ram_buf);
at45dbx_write_close();
// Read back this sector and compare to expected values
at45dbx_read_sector_open(TARGET_SECTOR);
at45dbx_read_sector_to_ram(ram_buf);
at45dbx_read_close();
for(i=0;i<AT45DBX_SECTOR_SIZE/2;i++) {
if (ram_buf[i]!=0xAA) {
test_ko();
}
}
for(;i<AT45DBX_SECTOR_SIZE;i++) {
if (ram_buf[i]!=0x55) {
test_ko();
}
}
// Write one data flash sector to 0x00, 0x01 ....
for(i=0;i<AT45DBX_SECTOR_SIZE;i++) {
ram_buf[i]=i;
}
at45dbx_write_sector_open(TARGET_SECTOR);
at45dbx_write_sector_from_ram(ram_buf);
at45dbx_write_close();
// Read one data flash sector to ram
at45dbx_read_sector_open(TARGET_SECTOR);
at45dbx_read_sector_to_ram(ram_buf);
at45dbx_read_close();
for(i=0;i<AT45DBX_SECTOR_SIZE;i++) {
if ( ram_buf[i]!=(i%0x100) ) {
test_ko();
}
}
while (1);
}
/*! \brief Main function.
*/
int main(void)
{
uint16_t i;
sysclk_init();
// Initialize the board.
// The board-specific conf_board.h file contains the configuration of the board
// initialization.
board_init();
at45dbx_init();
if(at45dbx_mem_check()==true) {
gpio_set_pin_low(DATA_FLASH_LED_EXAMPLE_0);
} else
{
test_ko();
}
// Prepare half a data flash sector to 0xAA
for(i=0;i<AT45DBX_SECTOR_SIZE/2;i++) {
ram_buf[i]=0xAA;
}
// And the remaining half to 0x55
for(;i<AT45DBX_SECTOR_SIZE;i++) {
ram_buf[i]=0x55;
}
at45dbx_write_sector_open(TARGET_SECTOR);
at45dbx_write_sector_from_ram(ram_buf);
at45dbx_write_close();
// Read back this sector and compare to expected values
at45dbx_read_sector_open(TARGET_SECTOR);
at45dbx_read_sector_to_ram(ram_buf);
at45dbx_read_close();
for(i=0;i<AT45DBX_SECTOR_SIZE/2;i++) {
if (ram_buf[i]!=0xAA) {
test_ko();
}
}
for(;i<AT45DBX_SECTOR_SIZE;i++) {
if (ram_buf[i]!=0x55) {
test_ko();
}
}
// Write one data flash sector to 0x00, 0x01 ....
for(i=0;i<AT45DBX_SECTOR_SIZE;i++) {
ram_buf[i]=i;
}
at45dbx_write_sector_open(TARGET_SECTOR);
at45dbx_write_sector_from_ram(ram_buf);
at45dbx_write_close();
// Read one data flash sector to ram
at45dbx_read_sector_open(TARGET_SECTOR);
at45dbx_read_sector_to_ram(ram_buf);
at45dbx_read_close();
for(i=0;i<AT45DBX_SECTOR_SIZE;i++) {
if ( ram_buf[i]!=(i%0x100) ) {
test_ko();
}
}
gpio_set_pin_low(DATA_FLASH_LED_EXAMPLE_1);
while (1);
}
