コード例 #1
0
ファイル: qpTestLog.c プロジェクト: eth0047/VK-GL-CTS
deBool Buffer_resize (Buffer* buffer, size_t newSize)
{
	/* Grow buffer if necessary. */
	if (newSize > buffer->capacity)
	{
		size_t		newCapacity	= (size_t)deAlign32(deMax32(2*(int)buffer->capacity, (int)newSize), 512);
		deUint8*	newData		= (deUint8*)deMalloc(newCapacity);
		if (!newData)
			return DE_FALSE;

		memcpy(newData, buffer->data, buffer->size);
		deFree(buffer->data);
		buffer->data		= newData;
		buffer->capacity	= newCapacity;
	}

	buffer->size = newSize;
	return DE_TRUE;
}
コード例 #2
0
ファイル: deInt32Test.c プロジェクト: crucible/deqp
void deInt32_selfTest (void)
{
	const int	NUM_ACCURATE_BITS	= 29;

	deRandom	rnd;
	deUint32	rcp;
	int			exp;
	int			numBits;

	deRandom_init(&rnd, 0xdeadbeefu-1);

	/* Test deClz32(). */
	DE_TEST_ASSERT(deClz32(0) == 32);
	DE_TEST_ASSERT(deClz32(1) == 31);
	DE_TEST_ASSERT(deClz32(0xF1) == 24);
	DE_TEST_ASSERT(deClz32(0xBC12) == 16);
	DE_TEST_ASSERT(deClz32(0xABBACD) == 8);
	DE_TEST_ASSERT(deClz32(0x10000000) == 3);
	DE_TEST_ASSERT(deClz32(0x20000000) == 2);
	DE_TEST_ASSERT(deClz32(0x40000000) == 1);
	DE_TEST_ASSERT(deClz32(0x80000000) == 0);

	/* Test simple inputs for dePop32(). */
	DE_TEST_ASSERT(dePop32(0) == 0);
	DE_TEST_ASSERT(dePop32(~0) == 32);
	DE_TEST_ASSERT(dePop32(0xFF) == 8);
	DE_TEST_ASSERT(dePop32(0xFF00FF) == 16);
	DE_TEST_ASSERT(dePop32(0x3333333) == 14);
	DE_TEST_ASSERT(dePop32(0x33333333) == 16);

	/* dePop32(): Check exp2(N) values and inverses. */
	for (numBits = 0; numBits < 32; numBits++)
	{
		DE_TEST_ASSERT(dePop32(1<<numBits) == 1);
		DE_TEST_ASSERT(dePop32(~(1<<numBits)) == 31);
	}

	/* Check exp2(N) values. */
	for (numBits = 0; numBits < 32; numBits++)
	{
		deUint32 val = (1u<<numBits);
		deRcp32(val, &rcp, &exp);

		DE_TEST_ASSERT(rcp == (1u<<DE_RCP_FRAC_BITS));
		DE_TEST_ASSERT(exp == numBits);
	}

	/* Check random values. */
	for (numBits = 0; numBits < 32; numBits++)
	{
		int NUM_ITERS = deMax32(16, 1 << (numBits/2));
		int iter;

		for (iter = 0; iter < NUM_ITERS; iter++)
		{
			const int	EPS = 1 << (DE_RCP_FRAC_BITS - NUM_ACCURATE_BITS);

			deUint32	val = (deRandom_getUint32(&rnd) & ((1u<<numBits)-1)) | (1u<<numBits);
			deUint32	ref = (deUint32)(((1.0f / (double)val) * (double)(1<<DE_RCP_FRAC_BITS)) * (double)(1u<<numBits));

			deRcp32(val, &rcp, &exp);

			DE_TEST_ASSERT(rcp >= ref-EPS && rcp < ref+EPS);
			DE_TEST_ASSERT(exp == numBits);
		}
	}

	DE_TEST_ASSERT(deBitMask32(0, 0) == 0);
	DE_TEST_ASSERT(deBitMask32(8, 0) == 0);
	DE_TEST_ASSERT(deBitMask32(16, 0) == 0);
	DE_TEST_ASSERT(deBitMask32(31, 0) == 0);
	DE_TEST_ASSERT(deBitMask32(32, 0) == 0);

	DE_TEST_ASSERT(deBitMask32(0, 2) == 3);
	DE_TEST_ASSERT(deBitMask32(0, 32) == 0xFFFFFFFFu);

	DE_TEST_ASSERT(deBitMask32(16, 16) == 0xFFFF0000u);
	DE_TEST_ASSERT(deBitMask32(31, 1) == 0x80000000u);
	DE_TEST_ASSERT(deBitMask32(8, 4) == 0xF00u);

	DE_TEST_ASSERT(deUintMaxValue32(1) == 1);
	DE_TEST_ASSERT(deUintMaxValue32(2) == 3);
	DE_TEST_ASSERT(deUintMaxValue32(32) == 0xFFFFFFFFu);

	DE_TEST_ASSERT(deIntMaxValue32(1) == 0);
	DE_TEST_ASSERT(deIntMaxValue32(2) == 1);
	DE_TEST_ASSERT(deIntMaxValue32(32) == 0x7FFFFFFF);

	DE_TEST_ASSERT(deIntMinValue32(1) == -1);
	DE_TEST_ASSERT(deIntMinValue32(2) == -2);
	DE_TEST_ASSERT(deIntMinValue32(32) == -0x7FFFFFFF - 1);
}