/**
* \brief Perform a simulation step.
*
* This function first reads the received frequency signal representing the
* power level the plate element is actuated with, then performs a simulation
* step and outputs the simulated temperature of the plate element as an analog
* value via DACB on the pin marked ADC2.
*
* The simulation plant is a discretized version of the continuous system:
* \f$ \dot{x} = \mathbf{F}*\vec{x} + \mathbf{B}*\vec{u} \f$, where:
* \f[
\begin{array}{c}
\mathbf{F} = \left[ \begin{array}{c c}
\frac{-1}{C_\textnormal{plate} * K_\textnormal{plate}} & 0 \\
\\
0 & \frac{-1}{C_\textnormal{pot} * K_\textnormal{pot}}
\end{array} \right] \\
\vec{x} = \left[ \begin{array}{c}
E_\textnormal{plate} \\
\\
E_\textnormal{pot}
\end{array} \right] \\
\mathbf{B} = \left[ \begin{array}{c c}
1 & 0 \\
\\
0 & 1
\end{array} \right] \\
\vec{u} = \left[ \begin{array}{c}
\frac{T_\textnormal{environment}}{K_\textnormal{plate}} \\
\\
\frac{T_\textnormal{environment}}{K_\textnormal{pot}}
\end{array} \right]
\end{array} \\
\f]
* in the case when the pot is OFF the plate.
*
* This corresponds to the plate and the pot cooling separately by Newton's law
* of cooling because no power can be induced when the pot is not on the plate.
*
* When the pot is ON the stove, the system is similar, but \b F is modified by
* adding heat transfer between the plate and the contents of the pot, and
* disregarding heat loss from the plate to the environment.
* Likewise \b u is modified by adding energy induction into the bottom of the
* pot, simplified here as being the same point as the plate:
* \f[
\begin{array}{c}
\mathbf{F} = \left[ \begin{array}{c c}
\frac{-1}{C_\textnormal{plate}* K_\textnormal{plate}} &
\frac{1}{C_\textnormal{pot}* K_\textnormal{plate}} \\
\\
\frac{1}{C_\textnormal{plate}* K_\textnormal{plate}} &
\frac{-1}{C_\textnormal{pot}* K_\textnormal{plate}}
- \frac{1}{C_\textnormal{pot} * K_\textnormal{pot}}
\end{array} \right] \\
\vec{u} = \left[ \begin{array}{c}
\delta E_\textnormal{induced} \\
\\
\frac{T_\textnormal{environment}}{K_\textnormal{pot}}
\end{array} \right]
\end{array}
\f]
*
*
* \param pot Whether the pot is on or off the plate.
*/
void oven_plant_sim_step(enum pot_t pot)
{
/* Remap period of incoming signal to power */
float u = oven_plant_calculate_u_from_period(
oven_plant_read_signal_period());
switch (pot) {
case POT_OFF:
state[0] = state[0] + u - (state[0] / C_PLATE - ENV_TEMP)
/ K_PLATE;
state[1] = state[1] - (state[1] / C_POT - ENV_TEMP) / K_POT;
break;
case POT_ON:
state[0] = state[0] + u - (state[0] / C_PLATE - state[1]
/ C_POT) / K_PLATE;
state[1] = state[1] + (state[0] / C_PLATE - state[1] / C_POT)
/ K_PLATE - (state[1] / C_POT - ENV_TEMP)
/ K_POT;
break;
default:
break;
}
/* Output DAC value, simulating an analog temperature sensor. */
dac_wait_for_channel_ready(&DACB, DAC_CH0);
dac_set_channel_value(&DACB, DAC_CH0, state[0] * 1);
return;
}
/**
* \brief Main application rutine
*/
int main (void)
{
/* Variables used to produce a saw tooth signal */
static uint16_t dac_data = 0;
static int8_t direction = 1;
board_init();
sysclk_init();
/* Calibrate the DAC */
dac_calibrate();
/* Generate a SAW tooth signal, just as a demo that the calibration works */
while (true) {
dac_wait_for_channel_ready(&DACB, DAC_CH0);
dac_set_channel_value(&DACB, DAC_CH0, dac_data);
dac_set_channel_value(&DACB, DAC_CH1, dac_data);
dac_data = dac_data + direction;
/* If the output value is the top value, switch direction */
if (dac_data == 4095) {
direction = -1;
}
/* If the output value is the lowest value, switch direction */
if (dac_data == 0) {
direction = 1;
}
}
}
/**
* \brief Changes the DAC ouput value
*
* \param volt Value to output on DAC pins
*/
static void main_dac_output(int16_t volt)
{
/* Samples of values used:
* | ADC0 | V+ | ADC1 | V- | V+ - V- |
* ---------------------------------------------
* | 4096 | Vcc | 0 | 0V | Vcc |
* | 3072 | Vcc 3/4 | 1024 | Vcc 1/4 | Vcc/2 |
* | 2048 | Vcc 1/2 | 2048 | Vcc 1/2 | 0V |
* | 1024 | Vcc 1/4 | 3072 | Vcc 3/4 | -Vcc/2 |
* | 0 | 0V | 4096 | Vcc | -Vcc |
*/
dac_wait_for_channel_ready(&DACA, DAC_CH0 | DAC_CH1);
dac_set_channel_value(&DACA, DAC_CH0,
(1 << 11) + (((1 << 11) * (int32_t)volt) / 3300));
dac_set_channel_value(&DACA, DAC_CH1,
(1 << 11) - (((1 << 11) * (int32_t)volt) / 3300));
dac_wait_for_channel_ready(&DACA, DAC_CH0 | DAC_CH1);
}
int main(void)
{
struct dac_config conf;
uint8_t i = 0;
board_init();
sysclk_init();
// Initialize the dac configuration.
dac_read_configuration(&SPEAKER_DAC, &conf);
/* Create configuration:
* - 1V from bandgap as reference, left adjusted channel value
* - one active DAC channel, no internal output
* - conversions triggered by event channel 0
* - 1 us conversion intervals
*/
dac_set_conversion_parameters(&conf, DAC_REF_BANDGAP, DAC_ADJ_LEFT);
dac_set_active_channel(&conf, SPEAKER_DAC_CHANNEL, 0);
dac_set_conversion_trigger(&conf, SPEAKER_DAC_CHANNEL, 0);
#if XMEGA_DAC_VERSION_1
dac_set_conversion_interval(&conf, 1);
#endif
dac_write_configuration(&SPEAKER_DAC, &conf);
dac_enable(&SPEAKER_DAC);
#if XMEGA_E
// Configure timer/counter to generate events at sample rate.
sysclk_enable_module(SYSCLK_PORT_C, SYSCLK_TC4);
TCC4.PER = (sysclk_get_per_hz() / RATE_OF_CONVERSION) - 1;
// Configure event channel 0 to generate events upon T/C overflow.
sysclk_enable_module(SYSCLK_PORT_GEN, SYSCLK_EVSYS);
EVSYS.CH0MUX = EVSYS_CHMUX_TCC4_OVF_gc;
// Start the timer/counter.
TCC4.CTRLA = TC45_CLKSEL_DIV1_gc;
#else
// Configure timer/counter to generate events at sample rate.
sysclk_enable_module(SYSCLK_PORT_C, SYSCLK_TC0);
TCC0.PER = (sysclk_get_per_hz() / RATE_OF_CONVERSION) - 1;
// Configure event channel 0 to generate events upon T/C overflow.
sysclk_enable_module(SYSCLK_PORT_GEN, SYSCLK_EVSYS);
EVSYS.CH0MUX = EVSYS_CHMUX_TCC0_OVF_gc;
// Start the timer/counter.
TCC0.CTRLA = TC_CLKSEL_DIV1_gc;
#endif
/* Write samples to the DAC channel every time it is ready for new
* data, i.e., when it is done converting. Conversions are triggered by
* the timer/counter.
*/
do {
dac_wait_for_channel_ready(&SPEAKER_DAC, SPEAKER_DAC_CHANNEL);
dac_set_channel_value(&SPEAKER_DAC, SPEAKER_DAC_CHANNEL, sine[i]);
i++;
i %= NR_OF_SAMPLES;
} while (1);
}
/**
* \internal
* \brief Test differential conversion with gain in 12-bit mode using the DAC
*
* This test outputs a gain compensated level on DAC output that should result
* in a value of half maximum positive value on the ADC.
*
* These values are then measured using the ADC on the pins that are connected
* to the DAC channel, and the results are compared and checked to see if they
* are within the acceptable range of values that passes the test.
*
* \param test Current test case.
*/
static void run_differential_12bit_with_gain_conversion_test(
const struct test_case *test)
{
// Number of MUX inputs that are to be read
const uint8_t num_inputs = 2;
/* Connection between DAC outputs and ADC MUX inputs.
* Only the high nibble on PORTA is possible for gain.
* input 4, 6 is connected to DACA0
* input 5, 7 is connected to DACA1.
*/
const uint8_t channel_pos[] = {4, 6};
const uint8_t channel_neg[] = {5, 7};
/*
* Go through gain level up to 8, since any higher gives too much
* propagated error for sensible unit test limits.
*/
const uint8_t gain[] = {1, 2, 4, 8};
uint8_t gain_index;
uint8_t adc_channel;
uint8_t mux_index;
int16_t results[2];
struct dac_config dac_conf;
struct adc_config adc_conf;
// Configure ADC
adc_read_configuration(&ADCA, &adc_conf);
adc_set_conversion_parameters(&adc_conf, ADC_SIGN_ON, ADC_RES_12,
ADC_REF_BANDGAP);
adc_set_clock_rate(&adc_conf, 2000UL);
adc_set_conversion_trigger(&adc_conf, ADC_TRIG_MANUAL, 1, 0);
adc_write_configuration(&ADCA, &adc_conf);
// Configure DAC
dac_read_configuration(&DACA, &dac_conf);
dac_set_conversion_parameters(&dac_conf, DAC_REF_BANDGAP,
DAC_ADJ_RIGHT);
dac_set_active_channel(&dac_conf, DAC_CH0 | DAC_CH1, 0);
dac_set_conversion_trigger(&dac_conf, 0, 0);
dac_set_conversion_interval(&dac_conf, 10);
dac_set_refresh_interval(&dac_conf, 20);
dac_write_configuration(&DACA, &dac_conf);
dac_enable(&DACA);
// Set negative output to zero
dac_wait_for_channel_ready(&DACA, DAC_CH1);
dac_set_channel_value(&DACA, DAC_CH1, DAC_MIN);
for (gain_index = 0; gain_index < sizeof(gain); gain_index++) {
// Set positive output to half positive range adjusted to gain
dac_wait_for_channel_ready(&DACA, DAC_CH0);
dac_set_channel_value(&DACA, DAC_CH0, DAC_MAX /
(gain[gain_index] * 2));
/* Read all ADC pins connected to active DAC output.
* All channels are converted NUM_SAMPLES times and the
* final value used for the assert is an average.
*/
for (adc_channel = 0; adc_channel < NUM_CHANNELS;
adc_channel++) {
differential_signed_average(&ADCA, 1 << adc_channel,
channel_pos, channel_neg, num_inputs,
results, gain[gain_index]);
for (mux_index = 0; mux_index < num_inputs;
mux_index++) {
verify_signed_result(test,
ADC_SIGNED_12BIT_MAX / 2,
results[mux_index],
adc_channel,
channel_pos[mux_index],
channel_neg[mux_index],
ADC_SIGNED_12BIT_MIN,
ADC_SIGNED_12BIT_MAX,
gain[gain_index], true);
}
}
}
}
/**
* \internal
* \brief Test differential conversion in 12-bit mode using the DAC
*
* This tests output three different values on the two DAC channels:
* - 1/2 * \ref DAC_MAX on both outputs to get a differential zero
* - \ref DAC_MAX on positive and \ref DAC_MIN on negative to get max positive
* result
* - \ref DAC_MIN on positive and \ref DAC_MAX on negative to get max negative
* result
*
* These values are then measured using the ADC on the pins that are connected
* to the DAC channel, and the results are compared and checked to see if they
* are within the acceptable range of values that passes the test.
*
* \param test Current test case.
*/
static void run_differential_12bit_conversion_test(
const struct test_case *test)
{
// Number of MUX inputs that are to be read
const uint8_t num_inputs = 4;
/* Connection between DAC outputs and ADC MUX inputs
* input 0, 2, 4, 6 is connected to DACA0
* input 1, 3, 5, 7 is connected to DACA1.
*/
const uint8_t channel_pos[] = {0, 2, 4, 6};
const uint8_t channel_neg[] = {1, 3, 5, 7};
uint8_t adc_channel;
uint8_t mux_index;
int16_t results[4];
struct dac_config dac_conf;
struct adc_config adc_conf;
// Configure ADC
adc_read_configuration(&ADCA, &adc_conf);
adc_set_conversion_parameters(&adc_conf, ADC_SIGN_ON, ADC_RES_12,
ADC_REF_BANDGAP);
adc_set_clock_rate(&adc_conf, 2000UL);
adc_set_conversion_trigger(&adc_conf, ADC_TRIG_MANUAL, 1, 0);
adc_write_configuration(&ADCA, &adc_conf);
// Configure DAC
dac_read_configuration(&DACA, &dac_conf);
dac_set_conversion_parameters(&dac_conf, DAC_REF_BANDGAP,
DAC_ADJ_RIGHT);
dac_set_active_channel(&dac_conf, DAC_CH0 | DAC_CH1, 0);
dac_set_conversion_trigger(&dac_conf, 0, 0);
dac_set_conversion_interval(&dac_conf, 10);
dac_set_refresh_interval(&dac_conf, 20);
dac_write_configuration(&DACA, &dac_conf);
dac_enable(&DACA);
// Set outputs to same (1/2 * MAX_VALUE) to get zero
dac_wait_for_channel_ready(&DACA, DAC_CH0 | DAC_CH1);
dac_set_channel_value(&DACA, DAC_CH0, DAC_MAX / 2);
dac_set_channel_value(&DACA, DAC_CH1, DAC_MAX / 2);
/* Read all ADC pins connected to active DAC output.
* All channels are converted NUM_SAMPLES times and the
* final value used for the assert is an average.
*/
for (adc_channel = 0; adc_channel < NUM_CHANNELS; adc_channel++) {
differential_signed_average(&ADCA, 1 << adc_channel,
channel_pos, channel_neg, num_inputs, results,
1);
for (mux_index = 0; mux_index < num_inputs; mux_index++) {
verify_signed_result(test, ADC_ZERO,
results[mux_index], adc_channel,
channel_pos[mux_index],
channel_neg[mux_index],
ADC_SIGNED_12BIT_MIN,
ADC_SIGNED_12BIT_MAX, 1, true);
}
}
// Set output to max positive range for positive result
dac_wait_for_channel_ready(&DACA, DAC_CH0 | DAC_CH1);
dac_set_channel_value(&DACA, DAC_CH0, DAC_MAX);
dac_set_channel_value(&DACA, DAC_CH1, DAC_MIN);
/* Read all ADC pins connected to active DAC output.
* All channels are converted NUM_SAMPLES times and the
* final value used for the assert is an average.
*/
for (adc_channel = 0; adc_channel < NUM_CHANNELS; adc_channel++) {
differential_signed_average(&ADCA, 1 << adc_channel,
channel_pos, channel_neg, num_inputs, results,
1);
for (mux_index = 0; mux_index < num_inputs; mux_index++) {
verify_signed_result(test, ADC_SIGNED_12BIT_MAX,
results[mux_index], adc_channel,
channel_pos[mux_index],
channel_neg[mux_index],
ADC_SIGNED_12BIT_MIN,
ADC_SIGNED_12BIT_MAX, 1, true);
}
}
// Set output to max negative range for negative result
dac_wait_for_channel_ready(&DACA, DAC_CH0 | DAC_CH1);
dac_set_channel_value(&DACA, DAC_CH0, DAC_MIN);
dac_set_channel_value(&DACA, DAC_CH1, DAC_MAX);
/* Read all ADC pins connected to active DAC output.
* All channels are converted NUM_SAMPLES times and the
* final value used for the assert is an average.
*/
for (adc_channel = 0; adc_channel < NUM_CHANNELS; adc_channel++) {
differential_signed_average(&ADCA, 1 << adc_channel,
channel_pos, channel_neg, num_inputs, results,
1);
for (mux_index = 0; mux_index < num_inputs; mux_index++) {
verify_signed_result(test, ADC_SIGNED_12BIT_MIN,
results[mux_index], adc_channel,
channel_pos[mux_index],
channel_neg[mux_index],
ADC_SIGNED_12BIT_MIN,
ADC_SIGNED_12BIT_MAX, 1, true);
}
}
}
/**
* \internal
* \brief Test single ended conversion in 8-bit mode using the DAC
*
* This tests output three different values on the two DAC channels:
* - 0 (output analog value is greater than 0, as the DAC cannot go that low)
* - 1/2 * \ref DAC_MAX Half of the maximum value of the DAC
* - \ref DAC_MAX The maximum value (VREF) of the DAC.
*
* These values are then measured using the ADC on the pins that are connected
* to the DAC channel, using all available ADC channels and the results are
* compared and checked to see if they are within the acceptable range of
* values that passes the test.
*
* \param test Current test case.
*/
static void run_single_ended_8bit_conversion_test(
const struct test_case *test)
{
// Number of MUX inputs that are to be read
const uint8_t num_inputs = 4;
/* Connection between DAC outputs and ADC MUX inputs
* input 0, 2, 4, 6 is connected to DACA0
* input 1, 3, 5, 7 is connected to DACA1.
*/
const uint8_t channelgroup[2][4] = {{0, 2, 4, 6}, {1, 3, 5, 7}};
uint8_t dac_channel;
uint8_t adc_channel;
uint8_t mux_index;
uint16_t results[4];
struct dac_config dac_conf;
struct adc_config adc_conf;
// Configure ADC
adc_read_configuration(&ADCA, &adc_conf);
adc_set_conversion_parameters(&adc_conf, ADC_SIGN_OFF, ADC_RES_8,
ADC_REF_BANDGAP);
adc_set_clock_rate(&adc_conf, 2000UL);
adc_set_conversion_trigger(&adc_conf, ADC_TRIG_MANUAL, 1, 0);
adc_write_configuration(&ADCA, &adc_conf);
// Configure DAC
dac_read_configuration(&DACA, &dac_conf);
dac_set_conversion_parameters(&dac_conf, DAC_REF_BANDGAP, DAC_ADJ_RIGHT);
dac_set_active_channel(&dac_conf, DAC_CH0 | DAC_CH1, 0);
dac_set_conversion_trigger(&dac_conf, 0, 0);
dac_set_conversion_interval(&dac_conf, 10);
dac_set_refresh_interval(&dac_conf, 20);
dac_write_configuration(&DACA, &dac_conf);
dac_enable(&DACA);
// Set outputs as zero
dac_wait_for_channel_ready(&DACA, DAC_CH0 | DAC_CH1);
dac_set_channel_value(&DACA, DAC_CH0, DAC_MIN);
dac_set_channel_value(&DACA, DAC_CH1, DAC_MIN);
for(dac_channel = 0; dac_channel < 2; dac_channel++) {
/* Read all ADC pins connected to active DAC output.
* All channels are converted NUM_SAMPLES times and the
* final value used for the assert is an average.
*/
for (adc_channel = 0; adc_channel < NUM_CHANNELS;
adc_channel++) {
single_ended_unsigned_average(&ADCA, 1 << adc_channel,
(uint8_t *)&channelgroup[dac_channel],
num_inputs, results);
for (mux_index = 0; mux_index < num_inputs;
mux_index++) {
verify_unsigned_result(test,
ADC_ZERO,
results[mux_index],
dac_channel,
adc_channel,
channelgroup[dac_channel]
[mux_index],
ADC_UNSIGNED_8BIT_MAX, false);
}
}
}
// Set outputs as 1/2 * MAX_VALUE
dac_wait_for_channel_ready(&DACA, DAC_CH0 | DAC_CH1);
dac_set_channel_value(&DACA, DAC_CH0, DAC_MAX / 2);
dac_set_channel_value(&DACA, DAC_CH1, DAC_MAX / 2);
for(dac_channel = 0; dac_channel < 2; dac_channel++) {
/* Read all ADC pins connected to active DAC output.
* All channels are converted NUM_SAMPLES times and the
* final value used for the assert is an average.
*/
for (adc_channel = 0; adc_channel < NUM_CHANNELS;
adc_channel++) {
single_ended_unsigned_average(&ADCA, 1 << adc_channel,
(uint8_t *)&channelgroup[dac_channel],
num_inputs, results);
for (mux_index = 0; mux_index < num_inputs;
mux_index++) {
verify_unsigned_result(test,
ADC_UNSIGNED_8BIT_MAX / 2,
results[mux_index],
dac_channel,
adc_channel,
channelgroup[dac_channel]
[mux_index],
ADC_UNSIGNED_8BIT_MAX, false);
}
}
}
// Set outputs as MAX_VALUE
dac_wait_for_channel_ready(&DACA, DAC_CH0 | DAC_CH1);
dac_set_channel_value(&DACA, DAC_CH0, DAC_MAX);
dac_set_channel_value(&DACA, DAC_CH1, DAC_MAX);
for(dac_channel = 0; dac_channel < 2; dac_channel++) {
/* Read all ADC pins connected to active DAC output.
* All channels are converted NUM_SAMPLES times and the
* final value used for the assert is an average.
*/
for (adc_channel = 0; adc_channel < NUM_CHANNELS;
adc_channel++) {
single_ended_unsigned_average(&ADCA, 1 << adc_channel,
(uint8_t *)&channelgroup[dac_channel],
num_inputs, results);
for (mux_index = 0; mux_index < num_inputs;
mux_index++) {
verify_unsigned_result(test,
ADC_UNSIGNED_8BIT_MAX,
results[mux_index],
dac_channel,
adc_channel,
channelgroup[dac_channel]
[mux_index],
ADC_UNSIGNED_8BIT_MAX, false);
}
}
}
}
int main(void)
{
struct dac_config conf;
board_init();
sysclk_init();
// Initialize the dac configuration.
dac_read_configuration(&OUTPUT_DAC, &conf);
/* Create configuration:
* - AVCC as reference, right adjusted channel value
* - both DAC channels active, no internal output
* - manually triggered conversions on both channels
* - 2 us conversion intervals
* - 10 us refresh intervals
*/
dac_set_conversion_parameters(&conf, DAC_REF_AVCC, DAC_ADJ_RIGHT);
dac_set_active_channel(&conf, DAC_CH0 | DAC_CH1, 0);
dac_set_conversion_trigger(&conf, 0, 0);
#if XMEGA_DAC_VERSION_1
dac_set_conversion_interval(&conf, 10);
dac_set_refresh_interval(&conf, 20);
#endif
dac_write_configuration(&OUTPUT_DAC, &conf);
dac_enable(&OUTPUT_DAC);
dac_wait_for_channel_ready(&OUTPUT_DAC, DAC_CH0 | DAC_CH1);
dac_set_channel_value(&OUTPUT_DAC, DAC_CH0, 0);
dac_set_channel_value(&OUTPUT_DAC, DAC_CH1, 0);
dac_wait_for_channel_ready(&OUTPUT_DAC, DAC_CH0 | DAC_CH1);
#if !XMEGA_E
// Configure timer/counter to generate events at conversion rate.
sysclk_enable_module(SYSCLK_PORT_C, SYSCLK_TC0);
TCC0.PER = (sysclk_get_per_hz() / RATE_OF_CONVERSION) - 1;
// Configure event channel 0 to generate events upon T/C overflow.
sysclk_enable_module(SYSCLK_PORT_GEN, SYSCLK_EVSYS);
EVSYS.CH0MUX = EVSYS_CHMUX_TCC0_OVF_gc;
// Start the timer/counter.
TCC0.CTRLA = TC_CLKSEL_DIV1_gc;
#else
// Configure timer/counter to generate events at conversion rate.
sysclk_enable_module(SYSCLK_PORT_C, SYSCLK_TC4);
TCC4.PER = (sysclk_get_per_hz() / RATE_OF_CONVERSION) - 1;
// Configure event channel 0 to generate events upon T/C overflow.
sysclk_enable_module(SYSCLK_PORT_GEN, SYSCLK_EVSYS);
EVSYS.CH0MUX = EVSYS_CHMUX_TCC4_OVF_gc;
// Start the timer/counter.
TCC4.CTRLA = TC45_CLKSEL_DIV1_gc;
#endif
/* Write samples to the DAC channel every time it is ready.
* Conversions are triggered by the timer/counter.
*/
do {
/* Wait for channels to get ready for new values, then set the
* value of one to 10% and the other to 90% of maximum.
*/
wait_for_timer();
dac_set_channel_value(&OUTPUT_DAC, DAC_CH0, 410);
dac_set_channel_value(&OUTPUT_DAC, DAC_CH1, 3686);
wait_for_timer();
dac_set_channel_value(&OUTPUT_DAC, DAC_CH0, 3686);
dac_set_channel_value(&OUTPUT_DAC, DAC_CH1, 410);
} while (1);
}
