예제 #1
0
void
TestBitVector_Run_IMP(TestBitVector *self, TestBatchRunner *runner) {
    TestBatchRunner_Plan(runner, (TestBatch*)self, 1029);
    test_Set_and_Get(runner);
    test_Flip(runner);
    test_Flip_Block_ascending(runner);
    test_Flip_Block_descending(runner);
    test_Flip_Block_bulk(runner);
    test_Mimic(runner);
    test_Or(runner);
    test_Xor(runner);
    test_And(runner);
    test_And_Not(runner);
    test_Count(runner);
    test_Next_Hit(runner);
    test_Clear_All(runner);
    test_Clone(runner);
    test_To_Array(runner);
    test_off_by_one_error();
}
예제 #2
0
void
TestBitVector_run_tests() {
    TestBatch *batch = TestBatch_new(1029);

    TestBatch_Plan(batch);
    test_Set_and_Get(batch);
    test_Flip(batch);
    test_Flip_Block_ascending(batch);
    test_Flip_Block_descending(batch);
    test_Flip_Block_bulk(batch);
    test_Mimic(batch);
    test_Or(batch);
    test_Xor(batch);
    test_And(batch);
    test_And_Not(batch);
    test_Count(batch);
    test_Next_Hit(batch);
    test_Clear_All(batch);
    test_Clone(batch);
    test_To_Array(batch);
    test_off_by_one_error();

    DECREF(batch);
}