示例#1
0
文件: cart.c 项目: Amon-X/yabause
void dram_4mbit_test ()
{
   unregister_all_tests();

   register_test(&test_dram_4mbit_init, "Init check");
   register_test(&test_dram_4mbit_range, "4MB range check");
   do_tests("DRAM 4MB tests", 0, 0);
}
		_test_suite::~_test_suite(void)
		{
			TRACE_ENTRY();

			unregister_all_tests();

			TRACE_EXIT();
		}
示例#3
0
void scsp_misc_test()
{
   scsp_minimal_init();
   unregister_all_tests();
   register_test(&scsp_int_on_timer_enable_test, "Int on Timer enable behaviour");
   register_test(&scsp_int_on_timer_reset_test, "Int on Timer reset behaviour");
   register_test(&scsp_int_dup_test, "No second Int after Timer done");
//   register_test(&scsp_mcipd_test, "MCIPD bit cleared after Timer Int");
   register_test(&scsp_scipd_test, "Timers start after SCIRE write");
   register_test(&scsp_scipd_test, "Timers start after MCIRE write");

   // DMA tests here

   // MSLC/CA tests here

   do_tests("SCSP Interrupt tests", 0, 0);
}
		_test_suite &
		_test_suite::operator=(
			__in const _test_suite &other
			)
		{
			TRACE_ENTRY();
			SERIALIZE_CALL_RECURSIVE(m_test_suite_lock);

			if(this != &other) {
				unregister_all_tests();
				m_run_count = other.m_run_count;
				m_test_map = other.m_test_map;
			}

			TRACE_EXIT();
			return *this;
		}
示例#5
0
void scsp_slot_test()
{
   scsp_minimal_init();
   unregister_all_tests();
   register_test(&scu_interrupt_test, "Key On/Off");
   register_test(&scsp_timer_a_test, "8/16-bit/Noise samples");
   register_test(&scsp_timer_a_test, "Source bit");
   register_test(&scsp_timer_a_test, "Looping");
   register_test(&scsp_timer_a_test, "Octaves"); // not sure I can easily test this
   register_test(&scsp_timer_a_test, "Attack rate"); // not sure I can easily test this
   register_test(&scsp_timer_a_test, "Decay rate"); // not sure I can easily test this
   register_test(&scsp_timer_a_test, "Decay level"); // not sure I can easily test this
   register_test(&scsp_timer_a_test, "Release rate"); // not sure I can easily test this
   register_test(&scsp_timer_a_test, "Total level");
   // modulation test here
   // LFO tests here
   // direct pan/sdl tests here
   do_tests("SCSP Timer tests", 0, 0);
}
示例#6
0
void scsp_timing_test()
{
   scsp_minimal_init();
   unregister_all_tests();
   register_test(&scu_interrupt_test, "Sound Request Interrupt");
   register_test(&scsp_timer_a_test, "Timer A");
   register_test(&scsp_timer_b_test, "Timer B");
   register_test(&scsp_timer_c_test, "Timer C");
/*
   register_test(&ScspTimerTimingTest0, "Timer timing w/1 sample inc");
   register_test(&ScspTimerTimingTest1, "Timer timing w/2 sample inc");
   register_test(&ScspTimerTimingTest2, "Timer timing w/4 sample inc");
   register_test(&ScspTimerTimingTest3, "Timer timing w/8 sample inc");
   register_test(&ScspTimerTimingTest4, "Timer timing w/16 sample inc");
   register_test(&ScspTimerTimingTest5, "Timer timing w/32 sample inc");
   register_test(&ScspTimerTimingTest6, "Timer timing w/64 sample inc");
   register_test(&ScspTimerTimingTest7, "Timer timing w/128 sample inc");
*/
   do_tests("SCSP Timer tests", 0, 0);
}
示例#7
0
文件: sh2.c 项目: 6lackmag3/yabause
void sh2_test()
{
   interrupt_set_level_mask(0xF);

   init_iapetus(RES_320x224);

   // Setup a screen for us draw on
   vdp_rbg0_init(&test_disp_settings);
   vdp_set_default_palette();

   // Display On
   vdp_disp_on();

   unregister_all_tests();
   register_test(&div_mirror_test, "DIV register access");
   register_test(&div_operation_test, "DIV operations");
   register_test(&div_interrupt_test, "DIV overflow interrupt");
   do_tests("SH2 tests", 0, 0);

   // Other tests to do: instruction tests, check all register accesses,
   // onchip functions
}